Digital Divide: A Bibliometric Approach to Existing Knowledge

Jorge Cruz-Cárdenas, Andrés Palacio-Fierro, Ekaterina Zabelina, Olga Deyneka, Carlos Ramos-Galarza

Producción científica: Capítulo del libro/informe/acta de congresoContribución de conferenciarevisión exhaustiva

Resumen

The topic of digital divide - the gap between those who have and those who do not have access to digital technologies - is of growing interest for both public and private sectors. This interest is reflected in an increasing number of academic and scientific publications focused on the topic. This study presents an overview of the digital divide research using a bibliometric approach. Analyzing 9,523 documents from the Scopus database, this study found that 1) there has been an accelerated growth in the publication rate on digital divide since 2018; 2) digital divide is a multidisciplinary field, led by the United States and other developed countries and some emerging countries; 3) the dominant term used to refer to the field, as per our analysis of the relevant keywords, is "digital divide"; and 4) as per our analysis of the evolution of keywords' importance, while topics related to technologies were of interest several years ago, current interest revolves around the effects of the Covid-19 pandemic, the elderly, education, and healthcare access.

Idioma originalInglés
Título de la publicación alojadaECTM 2023 - 2023 IEEE 7th Ecuador Technical Chapters Meeting
EditoresDavid Rivas Lalaleo, Manuel Ignacio Ayala Chauvin
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9798350338232
DOI
EstadoPublicada - 2023
Publicado de forma externa
Evento7th IEEE Ecuador Technical Chapters Meeting, ECTM 2023 - Ambato, Ecuador
Duración: 10 oct. 202313 oct. 2023

Serie de la publicación

NombreECTM 2023 - 2023 IEEE 7th Ecuador Technical Chapters Meeting

Conferencia

Conferencia7th IEEE Ecuador Technical Chapters Meeting, ECTM 2023
País/TerritorioEcuador
CiudadAmbato
Período10/10/2313/10/23

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Publisher Copyright:
© 2023 IEEE.

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